In the production of highly specialized and expensive silicon wafers with its millions of transistors on a chip, a time-critical MES is necessary. Large amounts of measured values have to be tested and stored in short time without any influence on the cycle times.
A new method was used in production where wafers were quality tested during the production process. apromaceMES was the system of choice for the customer because it meets all the high requirements for data storage, visualization and analysis, and thus significantly enhances the quality process.